Springer手冊精選系列·納米技術手冊:掃描探針顯微鏡(第3冊)(第3版·影印版)
定 價:48 元
叢書名:Springer手冊精選系列
- 作者:[美] 布尚(Bharat Bhushan) 編
- 出版時間:2013/1/1
- ISBN:9787560339498
- 出 版 社:哈爾濱工業(yè)大學出版社
- 中圖法分類:TB383-62
- 頁碼:215
- 紙張:膠版紙
- 版次:3
- 開本:16開
《Springer手冊精選系列·納米技術手冊:掃描探針顯微鏡(第3冊)(第3版·影印版)》具有先進、全面、易查、實用等特點,是非常實用的跨學科工具書,可供從事或即將從事這一領域研究的研究人員、科學家和工程師參考,也可供教學人員和研究生、高年級本科生使用。
《納米技術手冊》詳盡闡述基本概念及納米材料、器件、加工等內容;1500多幅插圖、眾多的綜合表幫助理解和使用;給出了詳盡的參考數(shù)據(jù)。
Dr. Bharat Bhushan received an M.S. in mechanical engineering from the Massachusetts Institute of Technology in 1971,an M.S. in mechanics and a Ph.D. in mechanical engineering from the University of Colorado at Boulder in 1973 and 1976,respectively,an MBA from Rensselaer Polytechnic Institute at Troy,NY in 1980,Doctor Technicae from the University of Trondheim atTrondheim,Norway in 1990,a Doctor of Technical Sciences from the Warsaw University of Technology at Warsaw,Poland in 1996,and Doctor Honouris Causa from the National Academy of Sciences at Gomel,Belarus in 2000. He is a registered professional engineer. He is presently an Ohio Eminent Scholar and The Howard D. Winbigler Professor in the College of Engineering,and the Director of the Nanoprobe Laboratory for Bio- and Nanotechnology and Biomimetics (NLB2) at the Ohio State University,Columbus,Ohio.His research interests include fundamental studies with a focus on scanning probe techniques in the interdisciplinary areas of bio/nanotribology,bio/nanomechanics and bio/nanomaterials characterization,and applications to bio/nanotechnology and biomimetics. He is an internationally recognized expert of bio/nanotribology and bio/nanomechanics using scanmng probe microscopy,and is one of the most prolific authors. He is considered by some a pioneer of the tribology and mechanics of magnetic storage devices. He has authored 6 scientific books,more than 90 handbook chapters,more than 700 scientific papers (h factor - 45+; ISI Highly Cited in Materials Science,since 2007),and more than 60 technical reports,edited more than 45 books,and holds 17 US and foreign patents. He is co-editor of Springer Nano Science and Technology Series and coeditor of Microsystem Technologies. He has given more than 400 invited presentations on six continents and more than 140 keynote/plenary addresses at major international conferences.
縮略語
Part C 掃描探針顯微鏡
21.掃描探針顯微鏡——工作原理、檢測方法和探測
21.1 掃描隧道顯微鏡
21.2 原子力顯微鏡
21.3 原子力顯微鏡檢測方法與分析
參考文獻
22.掃描顯微鏡的普通探針和特殊探針
22.1 原子力顯微鏡
22.2 掃描隧道顯微鏡
參考文獻
23.非接觸式原子力顯微鏡及相關問題
23.1 原子力顯微鏡
23.2 半導體中的應用
23.3 絕緣體中的應用
23.4 分子中的應用
參考文獻
24.低溫掃描探針顯微鏡
24.1 顯微鏡低溫操作
24.2 檢測方法
24.3 掃描隧道顯微鏡與光譜學
24.4 掃描力顯微鏡與光譜學
參考文獻
25.動態(tài)力顯微鏡中的高諧波和時變力
25.1 輕敲模式原子力顯微鏡的探針樣品的相互作用力建模
25.2 增強時變力下的懸臂梁響應
25.3 應用實例
25.4 高諧波小振幅力顯微鏡
參考文獻
26.原子力顯微鏡的動態(tài)模型
26.1 單原子鍵的測量機制
26.2 諧波振蕩器:原子力顯微鏡的動態(tài)模型系統(tǒng)
26.3 動態(tài)原子力顯微鏡的工作模型
26.4 Q-控制
26.5 動態(tài)原子力顯微鏡的耗散方法測量
26.6 結論
參考文獻
27.分子識別力學顯微鏡:從分子鍵到復雜的能量形貌
27.1 尖端化學配位
27.2 探針表面受體的固定
27.3 單分子識別的力學探測
27.4 分子識別力譜的原則
27.5 力譜識別:從孤立分子到生物膜
27.6 圖像識別
27.7 結束語
參考文獻